Researchers propose a “cross-layer reliability analysis from the semiconductor layer up to the application layer, able to quantify, in an accurate way, the reliability of hardware designs against soft ...
A technical paper titled “MetaSys: A Practical Open-Source Metadata Management System to Implement and Evaluate Cross-Layer Optimizations” was published by researchers at University of Toronto, ETH ...
A Virginia Tech College of Engineering researcher has won a five-year, $450,000 National Science Foundation Faculty Early Career Development (CAREER) award to spearhead the sorting of cross-layer ...
A cohort of 38 undergraduate students and first-year graduate students from more than 20 colleges and universities across the country attended the two-day “Cross-layer Computing Summer School: ...
Over the past decades, we have witnessed a rapid proliferation of smart devices, edge intelligence, and data-intensive services. These trends are pushing mobile data traffic to unprecedented levels.
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