The Design-for-Test (DFT) methodology is a strong driving force in the cost-effective testing of large-volume commodity items with very short life cycles, like system-on-chip (SoC) devices. It will ...
Test firm intros DFT systemNews from E-InSiteTeseda, an IC-test equipment startup from Portland, Oregon, has introduced the Teseda Validator 500, which it claims is the first design-for-test (DFT) ...
Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...
With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it ...
Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Modern SoCs are experiencing continued growth in capabilities and design sizes with more and more subsystem IPs being implemented. These large, complex, multi-core SoCs need strategies for DFT and ...
Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems. AI chips from companies like Graphcore and ...
EL DORADO HILLS, Calif. & HSINCHU, Taiwan--(BUSINESS WIRE)--SpringSoft, Inc., a global supplier of specialized IC design software, and Source III, Inc., a leading supplier of test vector translation ...
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