Applied Materials has launched the SEMVision™ H20, a new defect review system designed to enhance the analysis of nanoscale defects in advanced semiconductor chips. This system utilizes cutting-edge ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Manufacturing engineering encompasses the design, analysis and optimisation of processes that convert raw materials into finished goods. It spans a spectrum from traditional metal forming, machining ...

Machine learning is becoming increasingly valuable in semiconductor manufacturing, where it is being used to improve yield and throughput. This is especially important in process control, where data ...

Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...

Production delays and quality errors are a universal challenge in manufacturing. In Aerospace and defense (A&D), however, the stakes are especially high. An equipment failure or out-of-tolerance ...

A recent review article published in Advanced Materials explored the potential of artificial intelligence (AI) and machine learning (ML) in transforming thermoelectric (TE) materials design. The ...

Software testing in regulated sectors requires more than speed. See how to integrate AI while preserving accountability and ...