MILPITAS, Calif., July 10, 2018 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced two new defect inspection products, addressing two key challenges in tool and process monitoring ...
SAN JOSE, Calif. — Continuing on its collision course with Applied Materials Inc., rival KLA-Tencor Corp. is making a new bid in the defect review and classification equipment market. KLA-Tencor ...
KLA leverages cutting-edge semiconductor inspection tech, partnering with industry leaders like TSMC and Samsung. This positions them to capitalize on the growing demand for 2nm and 3nm chip ...
SAN JOSE–KLA-Tencor Corp. today announced it was offering the industry's first inline, non-contact system for monitoring electrical defects in processed wafers. The metrology giant claimed the new ...
Several companies are developing or shipping next-generation e-beam inspection systems in an effort to reduce defects in advanced logic and memory chips. Vendors are taking two approaches with these ...
KLA has announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned wafer inspection system, the C205 broadband plasma patterned wafer inspection ...
Failure analysis typically begins with identifying a region of interest (ROI) on a sample for detailed examination using tools such as a Scanning Electron Microscope (SEM), Focused Ion Beam (FIB), or ...
KLA's defect inspection and metrology equipment are essential for economically manufacturing advanced chips. The company returns value to investors through dividends and highly accretive share ...
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