MUNICH--(BUSINESS WIRE)--Cadence Design Systems, Inc. (NASDAQ: CDNS) today introduced the Cadence ® Legato™ Reliability Solution, the industry’s first software product that meets the challenges of ...

Using computer models to simulate product behavior was first used mainly to replace hardware prototyping to assess design performance at the end of the development cycle. However, with increasingly ...

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

Acquisition integrates advanced "shift-left" Design for Test (DFT) functionality into Siemens' Xpedition and Valor portfolios ...

Reliability has been an important factor in the semiconductor industry for decades. A closer look reveals three main priorities: In the area of technology development and optimization, the microscopic ...

Siemens plans to integrate Aster's advanced "shift-left" design for test functionality into Siemens' Xpedition and Valor ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

Modular and open test architectures enable engineers to build the right solution for each challenge, whether integrating ...

The impact of materials on designing reliable devices. How packaging plays an important role in SiC MOSFET design. Determining the FIT rate for SiC MOSFETs. There’s no doubt that the material ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

Have you ever wondered what journey a piece of equipment or machinery took before ending up in space? Or what testing was done before the rocket’s blastoff? Or why a piece of equipment failed ...

This strategic move integrates ASTER’s advanced "shift-left" design for test (DFT) functionality directly into Siemens' ...