The B4655A FPGA dynamic probe application works with the company’s logic analyzers to debug Xilinx FPGAs, including the Virtex-II, Virtex-II Pro, and Spartan-3 families. Interacting with on-chip ...

If you're working with a high-speed digital design, you likely face formidable measurement challenges every day. Unfortunately, in spite of tight project schedules and highly constrained budgets, ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Often underestimated, RF field probes are critical to the implementation of a proper radiated immunity test system. All too often, system specifiers gloss over this essential element after having ...