EDN

Optimizing functional-test throughput in PXI-based automated test systems

To ensure ongoing competitiveness, most manufacturing engineers are looking for new and better ways to optimize test throughput while ensuring measurement integrity. Manufacturing targets can be very ...
New Electronics

Emerson expands access to NI PXI test platform with lower‑cost automation hardware

Emerson has announced an expansion of its NI PXI automated test platform with a new range of high‑performance hardware designed to reduce costs while maintaining precision and reliability. Emerson ...
Automation World

NI Lowers Semiconductor ATE Cost With PXI-Based Test Systems

NI (Nasdaq: NATI), the provider of solutions that enable engineers and scientists to solve the world’s greatest engineering challenges, announced the NI Semiconductor Test System (STS) series. These ...
Business Wire

NI Brings Semiconductor ATE Digital Capability to PXI

AUSTIN, Texas--(BUSINESS WIRE)--NIWeek – NI (Nasdaq: NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, today ...
EDN

National Instruments NI PXIe-6556 and NI PXIe-4140/41 modules: Modules cut costs for semiconductor characterization and test

The NI PXIe-6556 high-speed digital I/O module enables the generation and acquisition of a digital waveform at up to 200 MHz or the performance of DC parametric measurements with one percent accuracy ...
Electronic Design

NI Taps Modular Hardware to Help Scale Up Production Testing

Check out our NI Connect 2022 coverage. For years, NI has focused on the ability of software to tie together its test equipment and evaluate vast quantities of data to help companies reduce their time ...