Analog fault simulation in mixed‐signal circuits is a critical tool for ensuring the robustness and reliability of systems that integrate both analogue and digital components. This field addresses the ...

How the challenges of electric-motor control design can be overcome using digital twins in all design and test phases. How automated testing within a continuous and integrated toolchain is able to ...

System-level testing is becoming essential for testing complex and increasingly heterogeneous chips, driven by rising demand for reliable parts in safety- and mission-critical applications. More and ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

NATICK, Mass.--(BUSINESS WIRE)--MathWorks unveiled Release 2023b (R2023b) of the MATLAB® and Simulink® product families today. R2023b introduces two new products and several major updates that provide ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Simulation technology is increasingly being utilised within the automotive space, saving time, money and allowing for simulated repeats of real-world scenarios again and again. Advanced Micro Devices ...