A version of this article also appeared in the May 2012 issue of Test & Measurement World. See the PDF. Test engineers have used open standard interfaces since1975, when the IEEE approved IEEE 488, ...
Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...
As modular test equipment continues to grow in popularity, so have the abundance of myths surrounding the advantages and disadvantages of modular compared to traditional “box” instruments (Figure 1 ...
Perhaps the most common question asked of me is to identify the measurement limits of modular standards like PXI, VXI, or AXIe. Is there some fundamental frequency limit, parametric accuracy limit, or ...
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