EDN

Improving fault coverage for random-pattern-resistant designs

Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...
Semiconductor Engineering

Debugging SystemVerilog Constraint Randomization: A Comprehensive Guide

Before delving into debugging, it is critical to have a solid understanding of the basics of SystemVerilog constraint randomization. Constraints are used to define the valid range of values for ...
EDN

Clock randomization automated methodology to validate SoC designs

The demand for new and upgraded features is increasing day by day in modern semiconductors. This may include multiple power domains to support low power and full power modes and multiple clock domains ...
Design-Reuse

Lockdown! Random Numbers Secure Network SoC Designs

Editor's note: To view a PDF version of this article, click here. The demand for networking equipment that incorporates virtual private networking (VPN) functionality is growing, fueled by companies' ...