New research paper titled “Supervised Learning for Coverage-Directed Test Selection in Simulation-Based Verification” from researchers at University of Bristol and Infineon Technologies. “Constrained ...

With 68% of the ASICs going through respins and 83% of the FPGA designs failing the first time around, verification poses interesting challenges. It’s also not a secret that nearly 60-70% of the cost ...

“This paper analyzes TCAD ESD simulation for both HBM zapping using real-world HBM ESD waveforms as stimuli and TLP testing using square wave TLP pulse trains as stimuli. It concludes that TCAD ESD ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

The title of this article may sound like the start of a Seinfeld joke from the 90s, but it’s actually a serious question. Many people do not appreciate what makes a system-on-chip (SoC) different from ...