The collaboration combines NEC’s industry-leading software with HID’s best-in-class hardware for public safety and beyond This collaboration brings together NEC’s advanced SmartScan™ software and ...
Santa Clara, CA. Park Systems said it is now shipping the Park SmartScan atomic force microscopy (AFM) nanoscopic tool, which boosts productivity by creating point-and-click reliable nanoscale images.
IRVING, Texas--(BUSINESS WIRE)--NEC Corporation of America (NEC), a leading provider and integrator of advanced IT, communications, networking, public safety and biometric solutions, today announced ...
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