Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in ...

Researchers have published research detailing their development of an AI framework to detect defects in additively ...

Test Research, Inc. has introduced the TR7950Q SII Series, an AI-powered wafer inspection and metrology platform designed for advanced packaging and back-end semiconductor processes. The system offers ...

Modern advanced packaging processes and shrinking semiconductor device sizes mean that it is vital to consistently eliminate sub-20 nm defects and surface contaminants. To do this effectively, the ...

A new wafer inspection platform combines AI analytics, sub-micron imaging, SWIR sensing, and precision metrology to help ...

The main objective of this project is to let students apply the image processing techniques that been taught in class in a given conditions based on their title. This particular project involved the ...