Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Engineers could avoid expensive redesigns by planning medical device testing early in development with expert guidance.

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...

Understanding connectivity issues and interactions are only part of the problem; ECOs can cause unexpected problems in other ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

The creation of a web theme that is unique and “infallible” is often challenging for any web designer. Even something simple can be a nightmare, as pages can appear differently in distinct browsers ...

Virtual system integration and test using Model-Based Design uncovers errors introduced in the requirements and design phases of embedded system development, well before the physical testing phase. As ...