A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...
AI Coding Assistants Increase Defect Risk by 30% in Unhealthy Code, New Peer-Reviewed Research Finds
The 30% Risk Spike: AI-generated code in "unhealthy" parts of the codebases leads to higher defect rates. The Context Gap: AI ...
Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...
(Editor's Note: This is the first of a series of articles that will define what is predicted yield improvement and how it can be measured or validated using test data) Design for Yield (DFY) tools are ...
Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. This article dives into the happens-before ...
Intel this week revealed defect density metrics for its 18A (1.8nm-class) process technology and said that it was healthy at the Deutsche Bank's 2024 Technology Conference. The company also said that ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results