This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...
Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
Implementation of the 5G radio frequency (RF) standard is increasing rapidly [1]. Over the past four to six quarters, there has been an increased focus on publications and products that have been ...
The test economics of state-of-the-art smartphones, tablets and routers demand highly parallel RF test. We are addressing this next wave in RF communications test, enabled by Wi-Fi 6E, operating in ...
Next-generation wireless applications are increasingly coping with new requirements for latency and higher data transmission rates, leading RF engineers to confront new test challenges at the ...
TOKYO, Nov. 18, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today unveiled the Wave Scale RF20ex instrument for the V93000 EXA Scale ...
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