Mathematicians are still trying to understand fundamental properties of the Fourier transform, one of their most ubiquitous ...
Abstract: The gate-all-around field-effect transistors (GAAFETs) are highly susceptible to performance variations caused by process-induced random variation. Line ...
Abstract: Electrical aging is one of the primary contributors to the insulation degradation of a power cable, along with the initiation and progression of partial discharge. Henceforth, the study of ...
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