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How we test computers

How We Test Computers ...
IEEE

Spatial Modeling with Automated Machine Learning and Gaussian Process Regression Techniques for Imputing Wafer Acceptance Test Data

Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...
IEEE

A Systematic Literature Review on Large Language Models Applications in Computer Programming Teaching Evaluation Process

Abstract: Tools based on the use of Large Language Models (LLMs) have improved the computer programming teaching process, automated feedback processes, facilitated program repair, and enabled ...