Abstract: As the complexity of autonomous driving systems (ADSs) increases, the question of how to organize testing in an efficient manner has become a serious issue. This study investigates the ...
Abstract: The die-attach layer is a vulnerable structure that is important to the reliability of an insulated-gate bipolar transistor (IGBT) module. A new failure mechanism named fatigue crack network ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results